Using Rapid-scan EPR to Improve the Detection Limit of Quantitative EPR by More Than One Order of Magnitude
Rapid-scan EPR, Quantitative EPR, Sensitivity, Amorphous silicon
College of Natual Science and Mathematics, Chemistry and Biochemistry
X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a conventional pulsed and continuous-wave EPR spectrometer for rapid-scan EPR.
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Möser, J, Lips, K, Tseytlin, M, Eaton, G.R, Eaton, S.S, & Schnegg, A. (2017). Using rapid-scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude. Journal of Magnetic Resonance (1997), 281, 17-25. DOI: 10.1016/j.jmr.2017.04.003.