Using Rapid-scan EPR to Improve the Detection Limit of Quantitative EPR by More Than One Order of Magnitude

Authors

J. Möser, Berlin Joint EPR Lab, Institut für Nanospektroskopie
K. Lips, Berlin Joint EPR Lab, Institut für Nanospektroskopie
Mark Tseitlin, West Virginia University
Gareth R. Eaton, University of DenverFollow
Sandra S. Eaton, University of DenverFollow
A. Schnegg, Berlin Joint EPR Lab, Institut für Nanospektroskopie

Publication Date

8-2018

Document Type

Article

Organizational Units

College of Natual Science and Mathematics, Chemistry and Biochemistry

Keywords

Rapid-scan EPR, Quantitative EPR, Sensitivity, Amorphous silicon

Abstract

X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a conventional pulsed and continuous-wave EPR spectrometer for rapid-scan EPR.

Publication Statement

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Recommended Citation

Möser, J, Lips, K, Tseytlin, M, Eaton, G.R, Eaton, S.S, & Schnegg, A. (2017). Using rapid-scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude. Journal of Magnetic Resonance (1997), 281, 17-25. DOI: 10.1016/j.jmr.2017.04.003.