Quantifying Spectral Diffusion by the Direct Measurement of the Correlation Function for Excitons in Semiconductor Quantum Wells

Authors

Rohan Singh, University of Colorado, University of Michigan
Galan Moody, University of Colorado, National Institute of Standards and Technology
Mark Siemens, University of DenverFollow
Hebin Li, Florida International University
Steven T. Cundiff, University of Colorado & National Institute of Standards and Technology, University of Michigan

Publication Date

6-6-2016

Document Type

Article

Organizational Units

College of Natual Science and Mathematics, Physics and Astronomy

Keywords

Excitons, Light matter interactions, Optical, Bloch equations, Photon echoes, Quantum dots, Quantum wells

Abstract

The phenomenon of spectral diffusion is common to a variety of inhomogeneously broadened systems. Spectral diffusion can be quantified through the frequency–frequency correlation function (FFCF), which is often approximated using observables from a variety of experimental techniques. We present a direct measurement of the temperature-dependent FFCF for excitons in semiconductor quantum wells using two-dimensional coherent spectroscopy. This technique enables the FFCF to be quantified without making any assumptions of the FFCF dynamics. Our results show that the Gauss–Markov approximation, which assumes exponential decay dynamics of the FFCF, is only valid for sample temperatures above 50 K. We compare our results with those obtained by the ellipticity and center-line slope measurements.

Publication Statement

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Recommended Citation

Singh, Rohan, Moody, Galan, Siemens, Mark E, Li, Hebin, and Cundiff, Steven T. "Quantifying Spectral Diffusion by the Direct Measurement of the Correlation Function for Excitons in Semiconductor Quantum Wells." Journal of the Optical Society of America. B, Optical Physics 33.7 (2016): C137. Web. doi: 10.1364/josab.33.00c137.